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Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Wu, G.*; Kitajima, Yoshinori*
Surface Science, 593(1-3), p.310 - 317, 2005/11
Times Cited Count:2 Percentile:11.64(Chemistry, Physical)Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids have been investigated. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed chlorobenzene.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Baba, Yuji; Imamura, Motoyasu*; Matsubayashi, Nobuyuki*; Shimada, Hiromichi*
Surface Science, 593(1-3), p.303 - 309, 2005/11
Times Cited Count:5 Percentile:26.1(Chemistry, Physical)no abstracts in English
Katayama, Atsushi; Furukawa, Katsutoshi; Watanabe, Kazuo
Bunseki Kagaku, 52(6), p.461 - 467, 2003/06
Times Cited Count:0 Percentile:0.01(Chemistry, Analytical)An imaging ion detection system was introduced to a time-of-flight mass spectrometer (TOFMS) in order to increase dynamic range in the isotope ratio measurements. The new detection system utilizes a position sensitive micro channel plate (MCP) with a phosphor plate and a CCD camera which records light spots on the MCP. Mass discriminated ion beams produced by laser resonance ionization were swept on the surface of MCP by a time-depended electric field located in front of the MCP. The resulting light spots were recorded as images by CCD camera. A mass spectrum was obtained from the images. The present method was applied to the isotope analysis of calcium. A dynamic range of more than 5 orders of magnitude was achieved.
Sekiguchi, Tetsuhiro; Ikeura, Hiromi*; Baba, Yuji
Surface Science, 532-535(1-3), p.1079 - 1084, 2003/06
Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, we have investigated orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed formic acid, formamide and benzene. For condensed formamide(HCOND), marked orientation effect was observed for the enhanced H-yields following C1s * resonance. Direct photodissociation and charge-neutralization play an important role in the effect. For some fragment species, however, the bond scission showed no polarization dependence when dissociation sites were far from core-excited atoms. This is the case for N-D scission and D-desorption following C1s excitation, suggesting that indirect process governs, where secondary electrons would induce the fragmentation.
Ikezoe, Yasumasa; Suzuki, Kazuya
Journal of the Mass Spectrometry Society of Japan, 48(4), p.254 - 262, 2000/04
no abstracts in English
Abe, Tetsuya; Hiroki, Seiji
FC Report, 15(12), p.276 - 278, 1997/00
no abstracts in English
Hiroki, Seiji; *; *; Abe, Tetsuya; Murakami, Yoshio
Journal of Nuclear Materials, 224, p.293 - 298, 1995/00
Times Cited Count:7 Percentile:59.15(Materials Science, Multidisciplinary)no abstracts in English
Ikezoe, Yasumasa; Soga, Takeshi; Suzuki, Kazuya; Ono, Shinichi*
Journal of the Mass Spectometry Society of Japan, 43(5), p.257 - 263, 1995/00
no abstracts in English
Hiroki, Seiji; *; Murakami, Yoshio
Vacuum, 46(12), p.1445 - 1447, 1995/00
Times Cited Count:7 Percentile:40.68(Materials Science, Multidisciplinary)no abstracts in English
Hiroki, Seiji; Abe, Tetsuya; Murakami, Yoshio
Review of Scientific Instruments, 65(6), p.1912 - 1917, 1994/06
Times Cited Count:20 Percentile:82.6(Instruments & Instrumentation)no abstracts in English
Hiroki, Seiji; Abe, Tetsuya; Murakami, Yoshio; *; *; *
Vacuum, 44(2), p.71 - 74, 1993/00
Times Cited Count:2 Percentile:16.19(Materials Science, Multidisciplinary)no abstracts in English
Hiroki, Seiji; Abe, Tetsuya; Murakami, Yoshio
Review of Scientific Instruments, 62(9), p.2121 - 2124, 1991/09
Times Cited Count:15 Percentile:81.27(Instruments & Instrumentation)no abstracts in English
Ikezoe, Yasumasa; *; *
Chemical Physics Letters, 177(4-5), p.366 - 370, 1991/03
Times Cited Count:12 Percentile:43.49(Chemistry, Physical)no abstracts in English
Hiroki, Seiji; Abe, Tetsuya; Obara, Kenjiro; Murakami, Yoshio
J. Vac. Sci. Technol., A, 9(1), p.154 - 157, 1991/01
no abstracts in English
Ikezoe, Yasumasa; Soga, Takeshi; Suzuki, Kazuya; Ono, Shinichi
JAERI-M 90-141, 55 Pages, 1990/09
no abstracts in English
Ikezoe, Yasumasa; Onuki, Kaoru; Shimizu, Saburo; *; Tagawa, S.*; Tabata, Yoneho*
Radiation Physics and Chemistry, 36(3), p.279 - 284, 1990/00
no abstracts in English
*; Ikezoe, Yasumasa
J.Phys.Chem., 92(5), p.1126 - 1133, 1988/05
no abstracts in English
Ikezoe, Yasumasa; ; Shimizu, Saburo; ; *; *
J.Phys.Chem., 88(24), p.5945 - 5948, 1984/00
no abstracts in English
Ikezoe, Yasumasa; *;
Shitsuryo Bunseki, 32(5), p.449R - 453R, 1984/00
no abstracts in English
; Abe, Shinichi
Nuclear Instruments and Methods, 212, p.533 - 537, 1983/00
no abstracts in English